New surface measurement tools from Uniscan Instruments.
Get greater accuracy and felxibility with the OSP270
30 May 2006: Omniscan Ltd would like to introduce the new OSP270 Non-contact surface profiling system from Uniscan Instruments, the Buxton based specialist manufacturer of electrochemical and surface measurement and electrochemistry instrumentation, complimenting its comprehensive line of surface measurement systems.
Benefiting from years of experience gained designing and building high precision scanning instrumentation, the Uniscan OSP270 enjoys exceptional performance for fast, accurate, non-contact surface measurement on an unlimited range of surfaces. The new 270 system incorporates the latest precision LU12 x,y,z stage design with higher stability, flatness and precision. Each scanning axis incorporates highly accurate optical encoders providing precise closed loop feedback positioning over the full scan length.
The displacement probe options include a wider choice of spot sizes, resolution and dynamic ranges and include both laser triangulation, confocal and chromatic aberration sensor heads. System control, data acquisition and signal conditioning software running under Microsoft WindowsXP embodies all the user helpful features that efficient, accurate, surface measurement demands. The new release of software allows two and three dimensional surface profile/maps to be acquired with over data points per map. Post data acquisition software has full clipboard support and allows any point to be measured in x y and z axes; the data is also exportable in ASCII format. Useful features include tilt removal, digital filtering and various arithmetic options for off-line post data acquisition analysis. The new OSP270 software has the following key features:
• Control and analysis software running under Microsoft Windows.
• 32 bit MDI Application.
• Control Functions include precise speed and position of height measurement sensor, all automatic scanning facilities for single linescan and two dimensional calibrated surface maps.
• Data resolution up to 256k samples per line giving up to 64Billion samples per 2D surface area map.
• Dynamic data display of all displacement (x,y,z) parameters via optical encoder readouts displayed on floating toolbar.
• Area zoom facility on 2D surface maps.
• Threshold display mode.
• Macro-analysis language for automatic signal processing of data files including: tilt correction, digital filtering, thresholding, arithmetic, statistics and auto-thresholding.
• Export of 1:1 tiff files (Bi-colour in threshold mode).
• High resolution display. User definable 16,777,216 colour palette via easy to use palette editor.
• Area map analysis with precise post data acquisition measuring spatial displacement and surface height at any point.
• Dimensional measurement including point to point, angle, radius of curvature etc.
• Full line and surface roughness statistics including Ra, Rp, Rq, Rv, Rt, Sa, Sp, Sq, Sv, St, Sst, Sku
To learn more about the OSP270 and other surface measurement and manipulation systems please visit us on stand H1 at Microscience.
For further information, please contact:
Russell Evans
Managing Director
Omniscan Ltd
T: 01244 378009
E: info@omniscan.co.uk
W: http://www.omniscan.co.uk |
