New UHV STM system perfoms Raman studies
Customisation and flexibility is key to success of new PolyScope system.
18 June 2006: Omniscan Ltd would like to introduce the new PolyScope500 UHV instrument from Danish Micro Engineering (DME) of Copenhagen, Denmark - the system is capable of supporting built-in Scanning Tunnelling Microscope (STM) and/or Atomic Force Microscope (AFM) facilities under very low pressure conditions. One recent version of the PolyScope system has been specially designed to support highly efficient light excitation and detection at the STM tip - sample interface, this system was designed specifically for Raman measurements and had the following characteristics:
• 5 axis manipulator between scanner and sample that holds an optical hemi-spherical mirror.
• In-vacuum tip exchange mechanism
• In-vacuum sample exchange mechanism
• Extensive internal area for user defined experimental apparatus (based around a 20” inner chamber diameter with four 10” flanges)
• High performance vacuum system achieves <1x10-9mbar
• Computer controlled UHV XYZ sample positioning system
For more information about the PolyScope and other instruments in our range of surface characterisation and manipulation systems please visit us at Microscience Stand H1.
For further information, please contact:
Russell Evans
Managing Director
Omniscan Ltd
T: 01244-378009
E: russell@omniscan.co.uk
W: http://www.omniscan.co.uk |
