Microscience 2006 Learning Zone

Microscope based Particle Analysis – Meets new QA standards

29 March 2006: Imaging Associates Ltd will exhibit the NEW Automated Particle Analyser from Carl Zeiss at MICROSCIENCE 2006. This advance in microscope based particle analysis enables accurate, high resolution detection of both small (<50 µm) and large (>50 µm) particles across the entire filter used in collection. As well as automating this time consuming procedure, the system meets the stringent demands of international standards of detection and characterisation required in QA labs throughout many industries. 
 
Until now, it has been necessary to analyse the entire filter by manual and time consuming methods. Accurate analysis of large particles lying across multiple images has also been very difficult if not impossible to achieve.  
 
The new Automated Particle Analyser addresses these limitations and optimises the process by automatically taking multiple high resolution images across the filter and then using mosaiX software to assemble multiple images into a combined single overview image. Pixel accuracy of the original image is retained and analysis of both large and small particles is then performed on the new mosaic image. 
 
The complete Particle Analyser system comprises of a microscope, motorised stage, brightfield and darkfield contrasting techniques, computer, TFT monitor and software. It meets all required QA standards (including International Particulate Contamination Standards ISO 16232, ISO 4406 and NAS 1683).  

For further information, please contact:

Dr Kay Jones
Imaging Associates Ltd
T: +44 (0) 1869 456242
E: kay.jones@obsidian.ltd.uk
W: http://www.imas.co.uk

 

  • Click here to register now for the MICROSCIENCE email newsletter
  •